Nanospec 3000
Description
A tabletop reflectance spectrometer that measures the thickness of standard thin films. The Nanospec has standard programs for the following films on silicon substrates.
A tabletop reflectance spectrometer that measures the thickness of standard thin films. The Nanospec has standard programs for the following films on silicon substrates.
Montana State University
P.O. Box 173780
Bozeman, MT 59717-3780