Metrology/Characterization Tools

Tool	Function	Subfield	Type	Facility
Agilent 6520 Q-TOF with Agilent 1100 nano-HPLC	Metrology/ Characterization	Chemical Analysis	Mass Spec	Mass Spec
Agilent 6538 Q-TOF with Agilent 1290 UHPLC	Metrology/ Characterization	Chemical Analysis	Mass Spec	Mass Spec
Ambios XP2	Metrology/ Characterization	Structure or Device	Profilometry	MMF
Bruker Autoflex	Metrology/ Characterization	Chemical Analysis	Mass Spec	Mass Spec
Bruker D8 Advance Powder X-ray Diffractometer	Metrology/ Characterization	Thin Film	PXD	ICAL
Bruker maXis Impact with Dionex 3000 nano-UHPLC	Metrology/ Characterization	Chemical Analysis	Mass Spec	Mass Spec
Bruker micrOTOF with Agilent 1290 UHPLC	Metrology/ Characterization	Chemical Analysis	Mass Spec	Mass Spec
Cameca ION TOF IV	Metrology/ Characterization	Thin Film	SIMS	ICAL
Elemental Scientific Lasers-NWR 193 system	Metrology/ Characterization	Chemical Analysis	Mass Spec	Mass Spec
Filmetrics Profilm 3D optical profilometer	Metrology/ Characterization	Structure or Device	Optical	MMF
Gaertner L116C ellipsometer	Metrology/ Characterization	Structure or Device	Optical	MMF
GC-MS Agilent	Metrology/ Characterization	Chemical Analysis	Chromatography	Mass Spec
Jandel 4-point probe	Metrology/ Characterization	Structure or Device	Electrical	MMF
Nanospec 3000	Metrology/ Characterization	Structure or Device	Optical	MMF
Nikon LV150	Metrology/ Characterization	Structure or Device	Optical	MMF
Scanning Auger Electron Microprobe	Metrology/ Characterization	Thin Film	Other	ICAL
Time-of-Flight Secondary Ion Mass Spectrometer	Metrology/ Characterization	Thin Film	SIMS	ICAL
Waters Synapt G2S-i Q-TOF with ion mobility	Metrology/ Characterization	Chemical Analysis	Mass Spec	Mass Spec
Wild	Metrology/ Characterization	Structure or Device	Optical	MMF
X-ray Photoelectron Spectrometer	Metrology/ Characterization	Thin Film	XPS	ICAL
X-ray Powder Diffraction Spectrometer	Metrology/ Characterization	Thin Film	XRD	ICAL

Contacts

If you are interested in using any of these tools, please email the facility that the tool falls under. A member of said facility will get back to as soon as possible.